Photoresist double patterning apparatus

ABSTRACT

An apparatus for etching an etch layer formed on a substrate is provided. A first photoresist (PR) mask with first mask features is provided on the etch layer. The apparatus performs a process for providing a protective coating on the first PR mask. The process includes at least one cycle. Each cycle includes (a) a deposition phase for depositing a deposition layer over the surface of the first mask features using a deposition gas, and (b) a profile shaping phase for shaping the profile of the deposition layer using a profile shaping gas. A liquid PR material is applied over the first PR mask having the protective coating. The PR material is patterned into a second mask features, where the first and second mask features form a second PR mask. The etch layer is etched though the second PR mask.

This application is a Division of U.S. application Ser. No. 12/338,947,filed on Dec. 18, 2008 and claims the benefit of priority of U.S.Provisional Application No. 61/016,404, filed on Dec. 21, 2007, which isincorporated herein by reference.

BACKGROUND OF THE INVENTION

The present invention relates to the formation of semiconductor devices.More specifically, the present invention relates to etching through apatterned mask.

During semiconductor wafer processing, features of the semiconductordevice are defined in the wafer using well-known patterning and etchingprocesses. In these processes, a photoresist (PR) material is depositedon the wafer and then is exposed to light filtered by a reticle. Thereticle is generally a glass plate that is patterned with exemplaryfeature geometries that block light from propagating through thereticle.

After passing through the reticle, the light contacts the surface of thephotoresist material. The light changes the chemical composition of thephotoresist material such that a developer can remove a portion of thephotoresist material. In the case of positive photoresist materials, theexposed regions are removed, and in the case of negative photoresistmaterials, the unexposed regions are removed. Thereafter, the wafer isetched to remove the underlying material from the areas that are nolonger protected by the photoresist material, and thereby define thedesired features in the wafer.

Various generations of photoresist are known. Deep ultra violet (DUV)photoresist is exposed by 248 nm light. Presently, for 248 nmphotoresist a typical critical dimension (CD) for the photoresist may be130-250 nm using conventional processes. Due to optical propertiesdependent on wavelength, photoresist exposed by longer wavelength lighthas larger theoretical minimal critical dimensions. In order to providefeatures with smaller CD, features formed using shorter wavelength lightare being pursued. 193 nm photoresist is exposed by 193 nm light. Usingphase shift reticles and other technology, a 55-100 nm CD photoresistpattern may be formed using 193 nm photoresist. This would be able toprovide a feature with a CD of 90-100 nm. 193 nm Immerrsion photoresistis exposed by 193nm light with water in direct contact with the wafersurface. Using phase shift reticles and other technology 55 nm CDphotoresist patterns may be formed and this will be extended in thefuture. This would be able to provide a feature with a sub 90 nm CD. EUV(13 nm) photoresist is exposed by 13nm light. Using this technology sub22 nm CD photoresist patterns may be formed. This would be able toprovide a feature with a sub 55 nm CD.

The use of shorter wavelength photoresists may provide additionalproblems over photoresists using longer wavelengths. To obtain CD'sclose to the theoretical limit, the lithography apparatus should be moreprecise, which would require more expensive lithography equipment.Shorter wavelength photoresists may not have selectivities as high aslonger wavelength photoresists and may more easily deform under plasmaetch conditions (except for EUV photoresists which typically use 248 nmbased backbones for their base polymers).

For photolithography printing, 193 nm immersion scanners for PR patternshave reached their limit in terms of the size of the optics whichdetermines the maxim resolution, i.e., the minimum pattern size they canprint. In order to go beyond the optical limit, for example, to achievea half-pitch pattern, the design pattern may be split into two masks.For example, in a dual line approach, a first PR mask pattern (with afirst set of lines) is printed using a first mask, and then a second PRpattern (with a second set of lines) is printed using a second mask. Thecombination of the first and second sets of lines will reduce the linepitch to a one-half. Such an approach is referred to as “doublepatterning” or “litho-etch-litho-etch” process. Conventionallitho-etch-litho-etch process typically involves etching a hardmasktwice: first through the first PR mask and then through the second PRmask. Certain litho-etch-litho-etch processes use two layers ofhardmasks; the first hardmask etched through the first PR mask; and thesecond hardmask selectively etched through the second PR mask. In eithercase, the first PR mask is stripped before the second PR mask is formed.

An alternative approach of double patterning uses a protective layer fora first PR mask, which is formed before applying a second PR materialonto the first PR mask. In general, when a liquid PR material is appliedonto a wafer having a patterned PR mask, the polymer of the patterned PRmask would dissolve when it comes in contact with most organic solvents.Thus, another type of formulated system, such as a water soluble, acidcross-linkable coating material, can be used to form a protective layeronto the first PR mask so as to prevent the patterned PR mask fromdissolving into an organic solvent of the second PR material. It ispreferable that the solvent of the protective coating material does notdissolve the first PR so that the coating does not disturb the firstpatterned PR significantly. Suitable solvents may be water,fluorosolvents, silicon solvents, or polar solvents like methanol,ethanol or other similar alcohols. When a water-soluble, acidcross-linkable protective layer is applied on to the first PR mask andbaked, the water is driven out and the residual amount of acid comes outfrom the first PR mask to its surface. Since the coating material isacid cross-linkable, a cross-linked polymer coat is formed on thesurface of the first PR mask. Then, the coating material that is notcross-linked can be washed away, leaving the first PR pattern with thecross-linked polymer coat. This process may be referred to as “chemicalfreeze” of the first PR mask pattern as it “freezes” the shape of thefirst PR mask.

However, although it is water soluble polymer, the cross-linkedprotective layer coat still has affinity with the organic solvent. Thus,when the second PR material is liquid-applied on top of the coated firstPR mask, the organic solvent of the liquid PR material causes thecross-linked area to form a “gel” and the first PR pattern swells and/ordeforms, which in turn causes line-edge roughness (LER), line distortionand/or line lifting and defects. In addition, in order to preserve theoriginal critical dimension (CD), it is preferable that the cross-linkedcoat on the first PR pattern is as thin as possible, but thisexacerbates the deformation problems

SUMMARY OF THE INVENTION

To achieve the foregoing and in accordance with the purpose of thepresent invention a method for etching an etch layer formed on asubstrate is provided. A first photoresist (PR) mask with it's firstmasked features is provided on the etch layer. A protective coating isprovided on the first PR mask by a process including at least one cycle.Each cycle includes (a) a deposition phase for depositing a depositionlayer over the surface of the first mask features using a depositiongas, and (b) a profile shaping phase for shaping the profile of thedeposition layer using a profile shaping gas. A liquid PR material isapplied over the first PR mask having the protective coating. The PRmaterial is patterned into a second mask features, where the first andsecond mask features form a second PR mask. The etch layer is etchedthough the second PR mask

In another embodiment of the invention an apparatus for providing aprotective coating layer on a patterned photoresist (PR) mask with firstmask features formed on an etch layer disposed on a substrate isprovided. The apparatus includes a plasma processing chamber, comprisinga chamber wall forming a plasma processing chamber enclosure, asubstrate support for supporting a substrate within the plasmaprocessing chamber enclosure, a pressure regulator for regulating thepressure in the plasma processing chamber enclosure, at least oneelectrode for providing power to the plasma processing chamber enclosurefor sustaining a plasma, at least one RF power source electricallyconnected to the at least one electrode, a gas inlet for providing gasinto the plasma processing chamber enclosure, and a gas outlet forexhausting gas from the plasma processing chamber enclosure. Theapparatus further includes a gas source in fluid connection with the gasinlet, the gas source comprising a deposition gas source and a profileshaping gas source. A controller is controllably connected to the gassource and the at least one RF power source. The controller includes atleast one processor and computer readable media. The computer readablemedia comprises computer readable code for providing a protectivecoating on a patterned PR mask comprising at least one cycle, thepatterned mask having first mask features, wherein computer readablecode for each cycle comprises computer readable code for flowing adeposition gas into the plasma chamber, computer readable code forforming a plasma from the deposition gas so as to deposit a depositionlayer over the surface of the first mask features, computer readablecode for stopping the flow of the deposition gas, computer readable codefor flowing a profile shaping gas into the plasma chamber, computerreadable code for forming a plasma from the profile shaping gas so as toshape the profile of the deposition layer; and computer readable codefor stopping the flow of the deposition gas.

These and other features of the present invention will be described inmore detail below in the detailed description of the invention and inconjunction with the following figures.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention is illustrated by way of example, and not by wayof limitation, in the figures of the accompanying drawings and in whichlike reference numerals refer to similar elements and in which:

FIG. 1 is a high level flow chart of a process that may be used in anembodiment of the invention.

FIGS. 2A-2E are schematic cross-sectional views of a stack processedaccording to an embodiment of the invention.

FIG. 3 is a more detailed flow chart of the step of forming a protectivecoating on the first PR mask in accordance with one embodiment of thepresent invention.

FIG. 4 is a schematic view of a plasma processing chamber that may beused in practicing the invention.

FIGS. 5A-5B illustrate a computer system, which is suitable forimplementing a controller used in embodiments of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

The present invention will now be described in detail with reference toa few preferred embodiments thereof as illustrated in the accompanyingdrawings. In the following description, numerous specific details areset forth in order to provide a thorough understanding of the presentinvention. It will be apparent, however, to one skilled in the art, thatthe present invention may be practiced without some or all of thesespecific details. In other instances, well known process steps and/orstructures have not been described in detail in order to notunnecessarily obscure the present invention.

The invention provides a novel “freeze” process for a PR mask which maybe used, for example, in double-patterning process. To facilitateunderstanding, FIG. 1 is a high level flow chart of a process that maybe used in an embodiment of the present invention. A first photoresist(PR) mask having first mask features is provided on an etch layer (step102). FIG. 2A is a schematic cross-sectional view of a layer to beetched 204 (etch layer) formed over a substrate 202, with a first PRmask 208 having a first PR mask features 210. An antireflective coating(ARC) layer 206 may be formed over the etch layer 204 below the first PRmask 208. The ARC layer 206 may be organic or inorganic, and may includea bottom antireflective coating (BARC) and/or a SiON layer. The etchlayer 204 may be an amorphous carbon layer (ACL) formed on a dielectriclayer. Such an ACL may be used as a hardmask for etching the underlyingdielectric layer. Amorphous carbon is similar to a polymer, but withless hydrogen and more carbon since it is deposited at high temperaturegreater than 200° C. by CVD, and thus it is more etch resistant thanpolymer. Alternatively, the etch layer 204 may be a dielectric layersuch as TEOS. However, the present invention is applicable to any etchlayers using a PR mask.

The first PR mask 208 may be patterned using a photolithography process,for example, the 193 nm water immersion lithography. However, the presetinvention is also applicable to other lithography processes. Forming thefirst PR mask 208 may include liquid application of a PR material ontothe wafer (by spin coating, for example), exposure to the light(scanning) using a first reticle, bake, and development. Thewater-soluble PR material may be washed away after the development. Thefirst PR mask features 210 may have a typical critical dimension (CD),which may be the width of the space 212 between adjacent mask featurepattern 210, about 55 nm to 100 nm, using conventional photolithographyprocesses.

A protective coating is then formed on the first PR mask 208 (step 104).FIG. 3 is a more detailed flow chart of the step 104 for forming theprotective coating on the first PR mask. In accordance with oneembodiment of the present invention, the protective coating is formed byat least one cycle of a two-phase process including a deposition phase302 and a profile shaping phase 304. Preferably, the two-phase cycle isrepeated 1 to 10 times. More preferably, the two-phase cycle is repeated2 to 3 times. In the deposition phase 302, a deposition layer isdeposited over the surface of the first mask features 210 using adeposition gas. In this example, the deposition phase 302 comprisesproviding a deposition gas and generating a plasma from the depositiongas to form a deposition layer. In this example, the deposition gas hasa polymer forming recipe. An example of such a polymer forming recipe isa hydrocarbon gas such as, CH₄, C₂H₂, and C₂H₄, and a fluorocarbon gas,such as CH₃F, CH₂F₂, CHF₃, C₄F₆, and C₄F₈. Another example of a polymerforming recipe would be a fluorocarbon chemistry and a hydrogencontaining gas, such as a recipe of CF₄ and H₂. FIG. 2B is a schematiccross-sectional view of the deposition layer 215 formed over the firstPR mask 208.

In the profile shaping phase 304, the deposition layer 215 is shaped oretched back using a profile shaping gas, such that at least thedeposition layer 215 on the bottom of the mask features 210 is removed.The profile shaping phase 304 includes providing an profile shaping gasand generating an profile shaping plasma from the profile shaping gas toshape the profile of the deposition layer. The profile shaping gas isdifferent from the deposition gas. As illustrated in FIG. 3, thedeposition phase 302 and the profile shaping phase 304 occur atdifferent times. In this example the profile shaping gas contains afluorocarbon chemistry, such as CF₄, CHF₃, and CH₂F₂. Other gases suchas O₂, N₂, and H₂ may be used.

FIG. 2C is a schematic cross-sectional view of the first PR mask 208with a protective coating layer 214 formed on the surface of the firstmask features 210, after the deposition layer 215 is shaped by theprofile shaping phase 304. The deposition-profile shaping cycle may berepeated more than once. Preferably, the protective coating is formed onthe top and sidewalls of the first mask features 210, but not on thebottom 224 of the first mask features, as shown in FIG. 2C. That is, theprotective coating layer 214 exposes the ARC 206. It is also desirablethat the protective coating layer 214 has substantially verticalsidewalls which are highly conformal. An example of a substantiallyvertical sidewall is a sidewall that from bottom to top makes an angleof between 88° to 90° with the bottom of the feature. Conformalsidewalls of the protective coating layer have substantially the samethickness from the top to the bottom of the mask feature. Non-conformalsidewalls may form a faceting or a bread-loafing formation, whichprovide non-substantially vertical sidewalls. In addition, it ispreferable that the protective coating layer 214 is as thin as possibleso as not to affect the original deign CD. For example, the thickness ofthe protective coating layer 214 may be about 0.5 nm to 30 nm, andpreferably, about 0.5 nm to 10 nm, and more preferably, 1 to 3 nm. Thenet thickness of the protective coating per cycle may be about 0.5 nm to30 nm, preferably, about 0.5 nm to 5 nm, and more preferably, 1 to 3 nm.The number of cycles may depend on the total thickness of the protectivecoating layer and the net thickness of the protective layer per cycle.

FIG. 4 is a schematic view of a plasma processing chamber 400 that maybe used for providing the protective layer on the first PR mask inaccordance with one embodiment of the present invention. The plasmachamber 400 may also used for subsequent etching process and strippingafter the second PR mask is formed. The plasma processing chamber 400comprises confinement rings 402, an upper electrode 404, a lowerelectrode 408, a gas source 410, and an exhaust pump 420. The gas source410 comprises a deposition gas source 412 and a profile shaping gassource 416. The gas source 410 may comprise additional gas sources, suchas an etching gas source 418 and a gas source for mask stripping (notshown). FIG. 4 also illustrates a spin coater 450.

Within plasma processing chamber 400, the substrate 202 is positionedupon the lower electrode 408. The lower electrode 408 incorporates asuitable substrate chucking mechanism (e.g., electrostatic, mechanicalclamping, or the like) for holding the substrate 202. The reactor top428 incorporates the upper electrode 404 disposed immediately oppositethe lower electrode 408. The upper electrode 404, lower electrode 408,and confinement rings 402 define the confined plasma volume 440. Gas issupplied to the confined plasma volume 440 by the gas source 410 and isexhausted from the confined plasma volume 440 through the confinementrings 402 and an exhaust port by the exhaust pump 420. A first RF source444 is electrically connected to the upper electrode 404. A second RFsource 448 is electrically connected to the lower electrode 408. Chamberwalls 452 surround the confinement rings 402, the upper electrode 404,and the lower electrode 408. Both the first RF source 444 and the secondRF source 448 may comprise a 60 MHz power source, a 27 MHz power sourceand a 2 MHz power source. Different combinations of connecting RF powerto the electrode are possible. In the case of Lam Research Corporation'sDielectric Etch Systems such as Exelan® Series, made by LAM ResearchCorporationTM of Fremont, California, which may be used in a preferredembodiment of the invention, the 60 MHz, 27 MHz, and 2 MHz power sourcesmake up the second RF power source 448 connected to the lower electrode,and the upper electrode is grounded.

A controller 435 is controllably connected to the RF sources 444, 448,exhaust pump 420, and the gas source 410. The Dielectric Etch Systemwould be used when the etch layer 204 is a dielectric layer, such assilicon oxide, organo silicate glass, or TEOS. The Dielectric EtchSystem may also used for etching or opening hardmask. The controller 435controls the RF sources 444, 448, exhaust pump 420, the deposition gassource 412, and the profile shaping gas source 416, and alternatelyperforms the deposition and the profile shaping as two phases of acycle. Using the two-phase cycle, which may be repeated more than once,the protective coating is formed so as to cover the surface of the firstPR mask features without covering the bottom of the mask features.

FIGS. 5A and 5B illustrate a computer system 500, which is suitable forimplementing a controller 435 (in FIG. 4) used in embodiments of thepresent invention. FIG. 5A shows one possible physical form of thecomputer system. Of course, the computer system may have many physicalforms ranging from an integrated circuit, a printed circuit board, and asmall handheld device up to a huge super computer. Computer system 500includes a monitor 502, a display 504, a housing 506, a disk drive 508,a keyboard 510, and a mouse 512. Disk 514 is a computer-readable mediumused to transfer data to and from computer system 500.

FIG. 5B is an example of a block diagram for computer system 500.Attached to system bus 520 is a wide variety of subsystems. Processor(s)522 (also referred to as central processing units, or CPUs) are coupledto storage devices, including memory 524. Memory 524 includes randomaccess memory (RAM) and read-only memory (ROM). As is well known in theart, ROM acts to transfer data and instructions uni-directionally to theCPU and RAM is used typically to transfer data and instructions in abi-directional manner. Both of these types of memories may include anysuitable of the computer-readable media described below. A fixed disk526 is also coupled bi-directionally to CPU 522; it provides additionaldata storage capacity and may also include any of the computer-readablemedia described below. Fixed disk 526 may be used to store programs,data, and the like and is typically a secondary storage medium (such asa hard disk) that is slower than primary storage. It will be appreciatedthat the information retained within fixed disk 526 may, in appropriatecases, be incorporated in standard fashion as virtual memory in memory524. Removable disk 514 may take the form of any of thecomputer-readable media described below.

CPU 522 is also coupled to a variety of input/output devices, such asdisplay 504, keyboard 510, mouse 512 and speakers 530. In general, aninput/output device may be any of: video displays, track balls, mice,keyboards, microphones, touch-sensitive displays, transducer cardreaders, magnetic or paper tape readers, tablets, styluses, voice orhandwriting recognizers, biometrics readers, or other computers. CPU 522optionally may be coupled to another computer or telecommunicationsnetwork using network interface 540. With such a network interface, itis contemplated that the CPU might receive information from the network,or might output information to the network in the course of performingthe above-described method steps. Furthermore, method embodiments of thepresent invention may execute solely upon CPU 522 or may execute over anetwork such as the Internet in conjunction with a remote CPU thatshares a portion of the processing.

In addition, embodiments of the present invention further relate tocomputer storage products with a computer-readable medium that havecomputer code thereon for performing various computer-implementedoperations. The media and computer code may be those specially designedand constructed for the purposes of the present invention, or they maybe of the kind well known and available to those having skill in thecomputer software arts. Examples of computer-readable media include, butare not limited to: magnetic media such as hard disks, floppy disks, andmagnetic tape; optical media such as CD-ROMs and holographic devices;magneto-optical media such as floptical disks; and hardware devices thatare specially configured to store and execute program code, such asapplication-specific integrated circuits (ASICs), programmable logicdevices (PLDs) and ROM and RAM devices. Examples of computer codeinclude machine code, such as produced by a compiler, and filescontaining higher level code that are executed by a computer using aninterpreter. Computer readable media may also be computer codetransmitted by a computer data signal embodied in a carrier wave andrepresenting a sequence of instructions that are executable by aprocessor.

One example of the deposition gas would be a fluorocarbon chemistry anda hydrogen containing gas, such as a recipe of CF₄ and H₂. In thisexample, power is supplied at 400 watts at 2 MHz and 800 watts at 27MHz. In each deposition phase, the deposition gas with the firstchemistry is provided in the chamber, a plasma is formed from thedeposition gas, and the deposition gas is stopped after the deposition.

One example of the profile shaping gas has a fluorocarbon chemistry,such as CF₄, CHF₃, and CH₂F₂. Other gases such as O₂, N₂, and H₂ may beused. In this example, power is supplied at 0 watts at 2 MHz and 800watts at 27 MHz. In each profile shaping phase, the profile shaping gaswith the second chemistry is provided in the chamber, a plasma is formedfrom the profile shaping gas, and the profile shaping gas is stoppedafter the profile shaping.

The deposition phase 302 and the profile shaping phase 304 may becontinuously performed in the same chamber without extinguishing theplasma, and the cycle may be repeated more than one, preferably 2-3times. By controlling various parameters, such as the process times ofthe deposition phase 302 and the profile shaping phase 304, number ofcycles, total deposition time, deposition/profile-shaping time ratio,gas chemistry ratio in each chemistry, the protective coating 214 can beformed in a desirable shape with a desirable thickness.

Referring back to FIG. 1, after forming the protective coating 214 onthe first PR mask (step 104), a liquid PR material is applied over thefirst PR mask (step 106). The second liquid application of the PRmaterial may be performed in a similar manner as the first applicationof the PR material for the first PR mask, for example, by spin-coating.The liquid PR material contains an organic solvent such as PEGMIA. Theprotective coating 214 protects the first mask features fromdeterioration by the organic solvent. Since the protective coating 214is formed by vapor phase deposition, not from the PR material, it doesnot have affinity with the solvent in the liquid PR material. Thus, theprotective coating allows no or little solvent to go though theprotective coating, and thus there is no or little interaction betweenthe patterned first PR mask and the liquid PR material applied thereon.Accordingly, the patterned first mask features maintain their originalshape, such as the original line pattern, protected by the protectivecoating.

Then, the second-applied PR material is patterned into second maskfeatures 216 (step 108). Patterning of the PR material into the secondmask features may be performed in a similar manner as the patterning ofthe first PR mask, for example, conventional photolithography process,using a second reticle corresponding to the second mask features. FIG.2D is a schematic cross-sectional view of a second PR mask 220 includingthe first mask features 208 and the second mask features 216. That is,the first mask features 208 and the second mask features 216 combinedtogether form the second PR mask 220. As shown in FIG. 2D, in accordancewith one embodiment of the present invention, the second mask features216 are provided between the first mask features 208. For example, inthe case of a line pattern, the first mask features 208 and the secondmask features 216 are alternately formed to achieve a smaller CD 226,for example, about 32 nm to 45 nm. However, the present invention is notlimited to line patterns, but can be applicable to any design patternsplitting where a two dimensional design pattern is split into twoseparate reticles, i.e., two set of PR mask features.

The substrate 202 is placed in the chamber, and the etch layer 204 isetched though the second PR mask (step 110). FIG. 2E shows a feature 222etched into the etch layer 204.

Additional formation steps (112) may then be performed. For example, thePR mask 220 may be stripped, and/or the subsequent etch step may beperformed to pattern features in the underlying layer.

While this invention has been described in terms of several preferredembodiments, there are alterations, permutations, and various substituteequivalents, which fall within the scope of this invention. It shouldalso be noted that there are many alternative ways of implementing themethods and apparatuses of the present invention. It is thereforeintended that the following appended claims be interpreted as includingall such alterations, permutations, and various substitute equivalentsas fall within the true spirit and scope of the present invention.

What is claimed is:
 1. An apparatus for providing a protective coatinglayer on a patterned photoresist (PR) mask with first mask featuresformed on an etch layer disposed on a substrate, comprising: a plasmaprocessing chamber, comprising: a chamber wall forming a plasmaprocessing chamber enclosure; a substrate support for supporting asubstrate within the plasma processing chamber enclosure; a pressureregulator for regulating the pressure in the plasma processing chamberenclosure; at least one electrode for providing power to the plasmaprocessing chamber enclosure for sustaining a plasma; at least one RFpower source electrically connected to the at least one electrode; a gasinlet for providing gas into the plasma processing chamber enclosure;and a gas outlet for exhausting gas from the plasma processing chamberenclosure; a gas source in fluid connection with the gas inlet, the gassource comprising: a deposition gas source; and a profile shaping gassource; a controller controllably connected to the gas source and the atleast one RF power source, comprising: at least one processor; andnon-transitory computer readable media, comprising: computer readablecode for performing a process of providing a protective coating on apatterned PR mask so as to prevent the patterned PR mask from dissolvinginto an organic solvent of a second PR material, wherein the protectivecoating comprises at least one cycle, the patterned mask having firstmask features, wherein computer readable code for each cycle comprises:computer readable code for flowing a deposition gas into the plasmachamber; computer readable code for depositing a deposition layer overthe surface of the first mask features by forming a plasma from thedeposition gas; computer readable code for stopping the flow of thedeposition gas; computer readable code for flowing a profile shaping gasinto the plasma chamber; computer readable code for shaping the profileof the deposition layer by forming a plasma from the profile shapinggas; and computer readable code for stopping the flow of the depositiongas; and computer readable code for patterning, after a liquid PRmaterial is applied over the first PR mask having the protective coatingthat is formed so as to prevent the patterned PR mask from dissolvinginto an organic solvent of a second PR material, the PR material into asecond mask features, wherein the first and second mask features form asecond PR mask, and wherein the protective coating allows no or littlesolvent to go through the protective coating.
 2. The apparatus asrecited in claim 1, wherein the computer readable code for performingthe process of providing the protective coating on the patterned PR maskfurther comprises: computer readable code for repeating the cycle one tothree times.
 3. The apparatus as recited in claim 1, wherein thecomputer readable code for performing the process for providing theprotective coating on the patterned PR mask further comprises: computerreadable code for repeating the cycle such that the protective coatinghas a thickness of about 0.5 to 3 nm.
 4. The apparatus as recited inclaim 1, wherein the computer readable media further comprises: computerreadable code for etching the etch layer though the second PR mask. 5.The apparatus as recited in claim 1, wherein said computer readable codefor patterning the PR material in to the second mask features includes:computer readable code for providing the second mask features betweenthe first mask features.
 6. The apparatus as recited in claim 1, whereinthe computer readable code for performing the process of providing theprotective coating on the patterned PR mask further comprises: computerreadable code for forming the protective coating on a top and sidewallsof the first mask features, but not on a bottom of the first maskfeatures.
 7. The apparatus as recited in claim 1, wherein the computerreadable code for shaping the profile of the deposition layer includes:computer readable code for removing a portion of the deposition layer ona bottom of the first mask features.
 8. The system as recited in claim1, wherein the performing a process of providing a protective coating ona patterned PR mask comprises vapor phase deposition.
 9. The system asrecited in claim 8, wherein the protective coating allows no or littlesolvent to go through the protective coating.
 10. The system as recitedin claim 9, wherein there is no or little interaction between thepatterned first PR mask and the liquid PR material applied thereon.